"Performance evaluation and influence of device parameters on threshold ..."

Yefei Zhang et al. (2015)

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DOI: 10.1109/ASICON.2015.7517160

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-17

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Yefei Zhang, Zunchao Li, Qingzhi Meng, Yunhe Guan, Dongxu Luo:
Performance evaluation and influence of device parameters on threshold voltage of dual-material strained gate-all-around MOSFET. ASICON 2015: 1-4

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