"A simple semi-analytical parameter extraction method for 40nm gatelength ..."

Panpan Yu et al. (2015)

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DOI: 10.1109/ASICON.2015.7517165

access: closed

type: Conference or Workshop Paper

metadata version: 2020-01-08

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Panpan Yu, Ying Zhou, Ling Sun, Jianjun Gao:
A simple semi-analytical parameter extraction method for 40nm gatelength MOSFET. ASICON 2015: 1-4

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