"Reliability concerns on time-to-digital converter due to bias temperature ..."

Xinsheng Wang, Lifeng Shang, Heyi Yin (2015)

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DOI: 10.1109/ASICON.2015.7517032

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-17

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Xinsheng Wang, Lifeng Shang, Heyi Yin:
Reliability concerns on time-to-digital converter due to bias temperature instability in nanometer era. ASICON 2015: 1-4

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