"Numerical Characterization of a 5-Layer (Pt/Ta/TaO/AlO/W) RRAM Device."

Jiahao Li, Wanlan Yang, Xing Zhou (2023)

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DOI: 10.1109/ASICON58565.2023.10396452

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-16

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Jiahao Li, Wanlan Yang, Xing Zhou:
Numerical Characterization of a 5-Layer (Pt/Ta/TaO/AlO/W) RRAM Device. ASICON 2023: 1-4

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