"A 65nm Reliable Near-Subthreshold Standard Cells Design Using Schmitt Trigger."

Jinliang Han et al. (2021)

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DOI: 10.1109/ASICON52560.2021.9620399

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-06

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Jinliang Han, Yongzhong Wen, Yuejun Zhang, Pengjun Wang, Huihong Zhang:
A 65nm Reliable Near-Subthreshold Standard Cells Design Using Schmitt Trigger. ASICON 2021: 1-4

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