"Characterization and Classification of Heavy Ion Induced Failures in ..."

Shuai Gao et al. (2021)

> Home

Details and statistics

DOI: 10.1109/ASICON52560.2021.9620393

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/asicon/GaoCNHL21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/asicon/GaoCNHL21
Shuai Gao, Chang Cai, Bingxu Ning, Ze He, Jie Liu:
Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits. ASICON 2021: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.