"The data retention improvement with 2T structure OTP on 0.18um CMOS ..."

Guanyu Chen et al. (2015)

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DOI: 10.1109/ASICON.2015.7517147

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-17

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Guanyu Chen, Feng Lin, Yongliang Gao, Chunxu Li, Duowu Wen, Zhe Zhang:
The data retention improvement with 2T structure OTP on 0.18um CMOS technology. ASICON 2015: 1-4

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