"Variability Aware Sub-Wavelength Lithography Characterization for Robust ..."

Petr Dobrovolný, Miguel Miranda, Paul Zuber (2011)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2013-05-16

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Petr Dobrovolný, Miguel Miranda, Paul Zuber:
Variability Aware Sub-Wavelength Lithography Characterization for Robust SRAM Design. ARCS Workshops 2011

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