"Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models."

Chuan-Shiuan Liang et al. (2023)

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DOI: 10.1109/APWCS60142.2023.10234059

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-13

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Chuan-Shiuan Liang, Zhenyu Xu, Jian-Yu Zhou, Chieh-Ming Yang, Jen-Yeu Chen:
Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models. APWCS 2023: 1-5

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