"Formal Verification of Memory Isolation for the TrustZone-based TEE."

Yuwei Ma et al. (2020)

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DOI: 10.1109/APSEC51365.2020.00023

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-20

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Yuwei Ma, Qianying Zhang, Shijun Zhao, Guohui Wang, Ximeng Li, Zhiping Shi:
Formal Verification of Memory Isolation for the TrustZone-based TEE. APSEC 2020: 149-158

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