"Main Parasitic Effects in Contactless Wafer Testing."

Alessandro Finocchiaro et al. (2018)

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DOI: 10.1007/978-3-030-11973-7_9

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-11

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  - conf/applepies/FinocchiaroGMPP18
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  - https://dblp.org/rec/conf/applepies/FinocchiaroGMPP18
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano:
Main Parasitic Effects in Contactless Wafer Testing. ApplePies 2018: 69-76

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