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"Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS."
Haipeng Zhang et al. (2010)
- Haipeng Zhang, Liang Zhang, Dejun Wang, Guohua Liu, Mi Lin, Xiaoyan Niu, Lingyan Fan:
Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS. APCCAS 2010: 1227-1230
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