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"$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier ..."
Dharmaray Nedalgi, Saroja V. Siddamal (2021)
- Dharmaray Nedalgi, Saroja V. Siddamal:
$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability. APCCAS 2021: 97-100
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