"A design for testability of non-volatile memory reliability test for ..."

Chung Chuang et al. (2012)

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DOI: 10.1109/APCCAS.2012.6419049

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Chung Chuang, Chun-Yen Wu, Chi-Chun Hsu, Li-Ren Huang, Wei-Min Cheng, Wen-Dar Hsieh:
A design for testability of non-volatile memory reliability test for automotive embedded processor. APCCAS 2012: 372-375

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