"Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error ..."

Duc-Phuc Nguyen et al. (2019)

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DOI: 10.1109/APCC47188.2019.9026538

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-16

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Duc-Phuc Nguyen, Khoa LeTrung, Fakhreddine Ghaffari, David Declercq:
Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry. APCC 2019: 502-506

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