"Reducing combinatorics in testing product lines."

Chang Hwan Peter Kim, Don S. Batory, Sarfraz Khurshid (2011)

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DOI: 10.1145/1960275.1960284

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Chang Hwan Peter Kim, Don S. Batory, Sarfraz Khurshid:
Reducing combinatorics in testing product lines. AOSD 2011: 57-68

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