"High-speed intermittent-contact mode scanning probe microscopy using ..."

Deepak R. Sahoo et al. (2009)

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DOI: 10.1109/ACC.2009.5160608

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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Deepak R. Sahoo, Walter Häberle, Peter Bächtold, Abu Sebastian, Haralampos Pozidis, Evangelos Eleftheriou:
High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor. ACC 2009: 2278-2283

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