"Post-Damage Short Circuit Detection in Lithium-ion Batteries."

Kiran Bhaskar, Jihoon Moon, Christopher D. Rahn (2024)

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DOI: 10.23919/ACC60939.2024.10645005

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-21

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Kiran Bhaskar, Jihoon Moon, Christopher D. Rahn:
Post-Damage Short Circuit Detection in Lithium-ion Batteries. ACC 2024: 3486-3491

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