"Atomic Force Microscopy control system for electrostatic measurements ..."

Sergey Belikov et al. (2012)

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DOI: 10.1109/ACC.2012.6315167

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-08

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Sergey Belikov, John Alexander, Sergei Magonov, Ivan Yermolenko:
Atomic Force Microscopy control system for electrostatic measurements based on mechanical and electrical modulation. ACC 2012: 3228-3233

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