"The Degree of Masking Fault Tolerance vs. Temporal Redundancy."

Nils Müllner, Oliver E. Theel (2011)

> Home

Details and statistics

DOI: 10.1109/WAINA.2011.137

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/aina/MullnerT11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aina/MullnerT11
Nils Müllner, Oliver E. Theel:
The Degree of Masking Fault Tolerance vs. Temporal Redundancy. AINA Workshops 2011: 21-28

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.