"Process monitoring of deep drawing using machine learning."

Tomohiro Tsuruya et al. (2019)

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DOI: 10.1109/AIM.2019.8868512

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Tomohiro Tsuruya, Musashi Danseko, Katsuhiko Sasaki, Shinya Honda, Ryo Takeda:
Process monitoring of deep drawing using machine learning. AIM 2019: 1227-1232

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