"Defect Detection on Randomly Textured Surfaces by Convolutional Neural ..."

Shing Yun Jung et al. (2018)

> Home

Details and statistics

DOI: 10.1109/AIM.2018.8452361

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/aimech/JungTCHS18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aimech/JungTCHS18
Shing Yun Jung, Ya-Hui Tsai, Wei-Yao Chiu, Jwu-Sheng Hu, Chuen-Tsai Sun:
Defect Detection on Randomly Textured Surfaces by Convolutional Neural Networks. AIM 2018: 1456-1461

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.