"A Framework for Self-Diagnosis and Condition Monitoring for Embedded ..."

Pieter Sartain et al. (2008)

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DOI: 10.1109/AHS.2008.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Pieter Sartain, Andrew B. T. Hopkins, Klaus D. McDonald-Maier, W. Gareth J. Howells:
A Framework for Self-Diagnosis and Condition Monitoring for Embedded Systems Using a SOM-Based Classifier. AHS 2008: 417-423

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