"Automated test procedure to detect permanent faults inside SRAM-based FPGAs."

Florian Rittner et al. (2017)

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DOI: 10.1109/AHS.2017.8046354

access: closed

type: Conference or Workshop Paper

metadata version: 2017-09-27

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Florian Rittner, Marko Ristic, Robért Glein, Albert Heuberger:
Automated test procedure to detect permanent faults inside SRAM-based FPGAs. AHS 2017: 16-23

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