"Determining minimal testsets for reversible circuits using Boolean ..."

Hongyan Zhang et al. (2011)

> Home

Details and statistics

DOI: 10.1109/AFRCON.2011.6072128

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/africon/ZhangFWD11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/africon/ZhangFWD11
Hongyan Zhang, Stefan Frehse, Robert Wille, Rolf Drechsler:
Determining minimal testsets for reversible circuits using Boolean satisfiability. AFRICON 2011: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.