"Development of high resolution magnetic field measurements for switching ..."

Christian Reil, Hans-Peter Schmidt (2017)

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DOI: 10.1109/AFRCON.2017.8095650

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type: Conference or Workshop Paper

metadata version: 2019-08-18

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Christian Reil, Hans-Peter Schmidt:
Development of high resolution magnetic field measurements for switching arc diagnosis of low-voltage switchgear. AFRICON 2017: 1185-1188

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