"On random testing of sequential digital logic with a high confidence ..."

Sunil R. Das (1986)

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DOI: 10.1145/324634.325336

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Sunil R. Das:
On random testing of sequential digital logic with a high confidence measure (abstract). ACM Conference on Computer Science 1986: 498

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