"Comparative Study and Analysis of Short Channel Effects for 180nm and 45nm ..."

Kiran Agarwal Gupta, Dinesh K. Anvekar, V. Venkateswarlu (2012)

> Home

Details and statistics

DOI: 10.1007/978-3-642-31600-5_69

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/acity/GuptaAV12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/acity/GuptaAV12
Kiran Agarwal Gupta, Dinesh K. Anvekar, V. Venkateswarlu:
Comparative Study and Analysis of Short Channel Effects for 180nm and 45nm Transistors. ACITY (3) 2012: 707-715

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.