"Power RF N-LDMOS ageing effect on conducted electromagnetic interferences."

Mohamed Tlig, Jaleleddine Ben Hadj Slama, M. A. Belaid (2013)

> Home

Details and statistics

DOI: 10.1109/SSD.2013.6564068

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/IEEEssd/TligSB13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/IEEEssd/TligSB13
Mohamed Tlig, Jaleleddine Ben Hadj Slama, M. A. Belaid:
Power RF N-LDMOS ageing effect on conducted electromagnetic interferences. SSD 2013: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.