"Automating Side-Channel Testing for Embedded Systems: A Continuous ..."

Philipp Schloyer et al. (2024)

> Home

Details and statistics

DOI: 10.1145/3664476.3670436

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/IEEEares/SchloyerKBM24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/IEEEares/SchloyerKBM24
Philipp Schloyer, Peter Knauer, Bernhard Bauer, Dominik Merli:
Automating Side-Channel Testing for Embedded Systems: A Continuous Integration Approach. ARES 2024: 173:1-173:6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.