"Partitioning algorithm to enhance VLSI testability."

Bassam Shaer, Sami A. Al-Arian, David L. Landis (1998)

> Home

Details and statistics

DOI: 10.1145/275295.275315

access: closed

type: Conference or Workshop Paper

metadata version: 2019-08-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ACMse/ShaerAL98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ACMse/ShaerAL98
Bassam Shaer, Sami A. Al-Arian, David L. Landis:
Partitioning algorithm to enhance VLSI testability. ACM Southeast Regional Conference 1998: 121-129

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.