"Infrared face recognition based on local binary patterns and ..."

Zhengzi Wang, Zhihua Xie (2014)

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DOI: 10.1109/ICIS.2014.6912131

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-15

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Zhengzi Wang, Zhihua Xie:
Infrared face recognition based on local binary patterns and Kruskal-Wallis test. ICIS 2014: 185-188

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