"Hierarchical characterization procedures for dimensional metrology."

David K. MacKinnon et al. (2011)

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DOI: 10.1117/12.872124

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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David K. MacKinnon, Jean-Angelo Beraldin, Luc Cournoyer, Benjamin Carrier:
Hierarchical characterization procedures for dimensional metrology. Three-Dimensional Imaging, Interaction, and Measurement 2011: 786402

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