"Preliminary study of statistical pattern recognition-based coin ..."

Marcus Leich et al. (2011)

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DOI: 10.1117/12.872360

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Marcus Leich, Stefan Kiltz, Christian Krätzer, Jana Dittmann, Claus Vielhauer:
Preliminary study of statistical pattern recognition-based coin counterfeit detection by means of high resolution 3D scanners. Three-Dimensional Imaging, Interaction, and Measurement 2011: 786412

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