"Modeling and compare of through-silicon-via (TSV) in high frequency."

Ran Wang, Gary Charles, Paul D. Franzon (2011)

> Home

Details and statistics

DOI: 10.1109/3DIC.2012.6263048

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/3dic/WangCF11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/3dic/WangCF11
Ran Wang, Gary Charles, Paul D. Franzon:
Modeling and compare of through-silicon-via (TSV) in high frequency. 3DIC 2011: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.