"Statistical Performance Analysis and Modeling Techniques for Nanometer ..."

Ruijing Shen, Sheldon X.-D. Tan, Hao Yu (2012)

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DOI: 10.1007/978-1-4614-0788-1

access: closed

type: Book or Thesis

metadata version: 2018-04-24

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Ruijing Shen, Sheldon X.-D. Tan, Hao Yu:
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. Springer 2012, ISBN 978-1-4614-0787-4, pp. I-XXIX, 1-305

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