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C. Ridgway

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2000 – 2009

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2003
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E. R. Davies, Michael Bateman, D. R. Mason, J. Chambers, C. Ridgway:
Design of efficient line segment detectors for cereal grain inspection. Pattern Recognit. Lett. 24(1-3): 413-428 (2003)

1990 – 1999

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1998
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Edward Roy Davies, D. R. Mason, Michael Bateman, J. Chambers, C. Ridgway:
Linear feature detectors and their application to cereal inspection. EUSIPCO 1998: 1-4

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