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2010 – 2019
- 2019
[j10]Yang Feng
, Zixuan Lu, Wenke Lu, Changchun Zhu, Qinghong Liu, Haoxin Zhang:
Study of the Doubly Clamped Beam Yarn Tension Sensor Based on the Surface Acoustic Wave. IEEE Trans. Ind. Electron. 66(4): 3256-3264 (2019)- 2014
- [j9]Xiaozhou Lü, Wenke Lu, Changchun Zhu:
Compensated SAW Yarn Tension Sensor. IEEE Trans. Instrum. Meas. 63(12): 3162-3168 (2014) - 2010
- [j8]Wenke Lu, Changchun Zhu:
Solving Three Key Problems of Wavelet Transform Processor Using Surface Acoustic Wave Devices. IEEE Trans. Ind. Electron. 57(11): 3801-3806 (2010)
2000 – 2009
- 2009
- [j7]Zhou Chungui, Zhang Xinong, Xie Shilin, Zhou Tong, Changchun Zhu:
Hybrid modeling of wire cable vibration isolation system through neural network. Math. Comput. Simul. 79(10): 3160-3173 (2009) - [j6]Changbao Wen, Changchun Zhu, Yongfeng Ju, Yanzhang Qiu, Hongke Xu, Wenke Lu:
Optimal Frequency Band Design Scheme of Dyadic Wavelet Processor Array Using Surface Acoustic Wave Devices. IEEE Trans. Ind. Electron. 56(4): 949-955 (2009) - 2008
- [j5]Shiguang Shang, Changchun Zhu, Weihua Liu:
Enhanced field emission from printed CNTs by high-temperature sintering and plasma bombarding in hydrogen. Microelectron. J. 39(1): 85-89 (2008) - 2006
- [j4]Changhui Tian, Changchun Zhu, Xinghui Liu, Xiaoli Wang, Qikun Wang:
Observation on CNT-FED under various vacuum levels and calculation on number of electron-gas collisions. Displays 27(4-5): 178-182 (2006) - [j3]Weihua Liu, Changchun Zhu, Cao Meng, Fanguang Zeng:
On the uniformity of field emission in screen printed CNT-cathodes: The effects of the cathode roughness. Microelectron. J. 37(5): 404-408 (2006) - 2005
- [j2]Ying Wang, Changchun Zhu, Chunyu Wu, Junhua Liu:
Improving reliability of beveled power semiconductor devices passivated by SIPOS. Microelectron. Reliab. 45(3-4): 535-539 (2005) - 2002
- [j1]Shoucai Yuan, Changchun Zhu:
An IGBT DC subcircuit model with non-destructive parameters extraction and comparison with measurements. Microelectron. Reliab. 42(12): 1991-1996 (2002)
Coauthor Index
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