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A. Dommann

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2000 – 2009

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2008
[j2]
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  - journals/mr/NeelsDSPM08
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  - https://dblp.org/rec/journals/mr/NeelsDSPM08
Antonia Neels, A. Dommann, A. Schifferle, O. Papes, Edoardo Mazza:
Reliability and failure in single crystal silicon MEMS devices. Microelectron. Reliab. 48(8-9): 1245-1247 (2008)
2001
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  - journals/tie/MroskBEFFD01
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Joachim W. Mrosk, Lothar Berger, Christoph Ettl, Hans-Jörg Fecht, Gerhard Fischerauer, A. Dommann:
Materials issues of SAW sensors for high-temperature applications. IEEE Trans. Ind. Electron. 48(2): 258-264 (2001)

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