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2020 – today
- 2024
[j4]Xingguo Xiong, Jie Yang
, Renhai Zhong, Jinwei Dong, Jingfeng Huang, K. C. Ting, Yibin Ying, Tao Lin:
Integration of harvester trajectory and satellite imagery for large-scale winter wheat mapping using deep positive and unlabeled learning. Comput. Electron. Agric. 216: 108487 (2024)- [c8]Peiqiao Wu, Xingguo Xiong, Xuan Zhang, Bhushan Dharmadhikari:
Designing Enhanced Monte Carlo Power Depletion Simulation in PSPICE. EIT 2024: 674-678 - [c7]Xingguo Xiong, Renhai Zhong, Qiyu Tian, Tao Lin:
Deep Hierarchical Temporal Data Fusion Improves Yield Estimation under Extreme Climate Stress. IGARSS 2024: 4316-4319 - 2022
- [j3]Zhixian Lin, Renhai Zhong, Xingguo Xiong, Changqiang Guo, Jinfan Xu, Yue Zhu, Jialu Xu, Yibin Ying, K. C. Ting, Jingfeng Huang, Tao Lin:
Large-Scale Rice Mapping Using Multi-Task Spatiotemporal Deep Learning and Sentinel-1 SAR Time Series. Remote. Sens. 14(3): 699 (2022)
2010 – 2019
- 2019
- [j2]Xingguo Xiong, Mingzhou Lu, Weizhong Yang, Guanghui Duan, Qingyan Yuan, Mingxia Shen, Tomas Norton, Daniel Berckmans:
An Automatic Head Surface Temperature Extraction Method for Top-View Thermal Image with Individual Broiler. Sensors 19(23): 5286 (2019) - 2017
- [c6]Linfeng Zhang, Xingguo Xiong:
Optimization of the Power Flow in a Smart Home. REV 2017: 721-730
2000 – 2009
- 2008
- [c5]Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
Control Circuitry for Self-Repairable MEMS Accelerometers. EIAT/IETA 2008: 265-270 - [c4]Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
Material Fatigue and Reliability of MEMS Accelerometers. DFT 2008: 314-322 - 2006
- [c3]Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
Reliability Analysis of Self-Repairable MEMS Accelerometer. DFT 2006: 236-244 - 2005
- [j1]Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
A dual-mode built-in self-test technique for capacitive MEMS devices. IEEE Trans. Instrum. Meas. 54(5): 1739-1750 (2005) - [c2]Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
Design and Analysis of Self-Repairable MEMS Accelerometer. DFT 2005: 21-32 - 2004
- [c1]Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
A Dual-Mode Built-In Self-Test Technique for Capacitive MEMS Devices. VTS 2004: 148-153
Coauthor Index
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