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M. Schenkel

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2010
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Tommaso Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier:
Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. Microelectron. Reliab. 50(9-11): 1367-1372 (2010)

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