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A.-K. Geinzer

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2010 – 2019

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2010
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M. Fakhri, A.-K. Geinzer, Ralf Heiderhoff, L. J. Balk:
Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques. Microelectron. Reliab. 50(9-11): 1459-1463 (2010)

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