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Ameet Bagwe

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2000 – 2009

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2000
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Ameet Bagwe, Rubin A. Parekhji:
Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. Asian Test Symposium 2000: 260-
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Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji:
A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. ITC 2000: 417-425

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