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T. Cibáková

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Journal Articles

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2002
[j1]
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  - journals/mr/CibakovaFGKPRU02
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T. Cibáková, Mária Fischerová, Elena Gramatová, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar:
Hierarchical test generation for combinational circuits with real defects coverage. Microelectron. Reliab. 42(7): 1141-1149 (2002)

Conference and Workshop Papers

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2002
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André Schneider, Karl-Heinz Diener, Eero Ivask, Jaan Raik, Raimund Ubar, P. Miklos, T. Cibáková, Elena Gramatová:
Internet-Based Collaborative Test Generation with MOSCITO. DATE 2002: 221-226
2000
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Mykola Blyzniuk, T. Cibáková, Elena Gramatová, Wieslaw Kuzmicz, M. Lobur, Witold A. Pleskacz, Jaan Raik, Raimund Ubar:
Hierarchical defect-oriented fault simulation for digital circuits. ETW 2000: 69-74

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