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M. Stebniskey

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1990 – 1999

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1995
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A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, Mousumi Mitra Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey:
Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. ITC 1995: 328-335

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