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Jon R. Mandeville

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Journal Articles

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1993
[j1]
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  - journals/mva/RodriguezM93
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  - https://dblp.org/rec/journals/mva/RodriguezM93
Arturo A. Rodriguez, Jon R. Mandeville:
Image registration for automated inspection of printed circuit patterns using CAD reference data. Mach. Vis. Appl. 6(4): 233-242 (1993)

Conference and Workshop Papers

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1992
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A. Ravishankar Rao, Nagarajan Ramesh, Frederick Y. Wu, Jon R. Mandeville, Pieter J. M. Kerstens:
Algorithms for a fast confocal optical inspection system. WACV 1992: 298-305

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