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ORCIDIgor A. Kharitonov
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2020 – today
- 2021
[j3]Konstantin O. Petrosyants
, Lev M. Sambursky, Maxim V. Kozhukhov, Mamed R. Ismail-Zade, Igor A. Kharitonov, Bo Li:
SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(4): 708-722 (2021)
2010 – 2019
- 2018
- [c13]Konstantin O. Petrosyants, Igor A. Kharitonov:
SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits. EWDTS 2018: 1-6 - 2017
- [j2]Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov:
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model. J. Electron. Test. 33(1): 37-51 (2017) - [j1]Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin:
Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C). Microelectron. Reliab. 79: 416-425 (2017) - [c12]Igor A. Kharitonov:
Electro-thermo-rad SPICE models for SOI/SOS MOSFETs. EWDTS 2017: 1-8 - [c11]Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade:
Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications. EWDTS 2017: 1-8 - 2016
- [c10]Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov:
Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model. LATS 2016: 117-122 - 2014
- [c9]Konstantin O. Petrosyants, Artur Kortunov, Igor A. Kharitonov, Anton Popov, Natalya Gomanilova, Nikita I. Rjabov:
Analysis and Simulation of temperature-current rise in modern PCB traces. EWDTS 2014: 1-4 - [c8]A. N. Tikhonov, Boris G. Lvov, Konstantin O. Petrosyants, Saygid U. Uvaysov, Igor A. Kharitonov, S. V. Balakin, A. N. Chetyrkin, V. N. Krutikov:
The system of microelectronics education for aerospace industry based on "university-enterprise" link. EWME 2014: 137-141 - 2013
- [c7]Konstantin O. Petrosyants, Igor A. Kharitonov:
Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems. DSD 2013: 479-482 - [c6]Konstantin O. Petrosyants, P. A. Kozynko, Igor A. Kharitonov, A. V. Sidorov, Y. N. Chichkanov:
New version of automated electro-thermal analysis in Mentor Graphics PCB Design System. EWDTS 2013: 1-4 - [c5]Konstantin O. Petrosyants, Igor A. Kharitonov, D. A. Popov:
Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU. EWDTS 2013: 1-4 - [c4]Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, V. N. Bogatyrev, Z. M. Povarnitcyna, E. S. Drozdenko:
Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel. EWDTS 2013: 1-6 - 2011
- [c3]Konstantin O. Petrosyants, E. V. Orekhov, D. A. Popov, Igor A. Kharitonov, Lev M. Sambursky, A. P. Yatmanov, A. V. Voevodin, A. N. Mansurov:
TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies. EWDTS 2011: 188-190
2000 – 2009
- 2002
- [c2]Konstantin O. Petrosjanc, Igor A. Kharitonov, Alexej S. Adonin:
Multi-Level Testing Strategy for Radiation Hardened SOI/SOS ICs. LATW 2002: 199-204
1990 – 1999
- 1995
- [c1]Konstantin O. Petrosjanc, Igor A. Kharitonov, N. I. Rybov, Peter P. Maltcev:
Software system for semiconductor devices, monolith and hybrid ICs thermal analysis. EURO-DAC 1995: 360-365
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