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2010 – 2019
- 2016
[j11]Ulrich Stumper
, Thorsten Schrader, Rolf H. Judaschke:
Reflection Measurement of Low-Reflective Loads at Millimeter Waves. IEEE Trans. Instrum. Meas. 65(9): 2129-2136 (2016)- 2014
- [j10]Ulrich Stumper, Thorsten Schrader:
Calibration Method for Vector Network Analyzers Using One or Two Known Reflection Standards. IEEE Trans. Instrum. Meas. 63(6): 1648-1655 (2014) - 2012
- [j9]Ulrich Stumper, Thorsten Schrader:
Influence of Different Configurations of Nonideal Calibration Standards on Vector Network Analyzer Performance. IEEE Trans. Instrum. Meas. 61(7): 2034-2041 (2012) - 2011
- [j8]Ulrich Stumper:
Measurement of a Microwave Load Using One or Two Terminations of Known Reflection. IEEE Trans. Instrum. Meas. 60(6): 2126-2132 (2011)
2000 – 2009
- 2009
- [j7]Ulrich Stumper:
Influence of Nonideal Calibration Items on S-Parameter Uncertainties Applying the SOLR Calibration Method. IEEE Trans. Instrum. Meas. 58(4): 1158-1163 (2009) - 2007
- [j6]Ulrich Stumper:
Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method. IEEE Trans. Instrum. Meas. 56(2): 597-600 (2007) - 2005
- [j5]Ulrich Stumper:
Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items. IEEE Trans. Instrum. Meas. 54(2): 676-679 (2005) - 2003
- [j4]Ulrich Stumper:
Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements. IEEE Trans. Instrum. Meas. 52(2): 311-315 (2003) - 2001
- [j3]Andras Török, Dieter Janik, Wolfgang Peinelt, Dieter Stumpe, Ulrich Stumper:
Efficient broadband method for equivalent source reflection coefficient measurements. IEEE Trans. Instrum. Meas. 50(2): 361-363 (2001) - [j2]Ulrich Stumper:
Extended cross-ratio reflection correction at microwave frequencies using waveguide air-lines. IEEE Trans. Instrum. Meas. 50(2): 364-367 (2001)
1980 – 1989
- 1986
- [j1]Algirgas P. Jurkus, Ulrich Stumper:
National standards and standard measurement systems for impedance and reflection coefficient. Proc. IEEE 74(1): 39-45 (1986)
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