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ORCIDWing Chiu Tam
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2010 – 2019
- 2015
[j5]Wing Chiu Jason Tam, Ronald Shawn Blanton:
LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(8): 1278-1290 (2015)- 2014
- [j4]Wing Chiu Tam, R. D. (Shawn) Blanton:
Design-for-Manufacturability Assessment for Integrated Circuits Using RADAR. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(10): 1559-1572 (2014) - 2012
- [j3]R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku:
Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Des. Test Comput. 29(1): 36-47 (2012) - [j2]Wing Chiu Tam, Ronald D. Blanton:
Physically-Aware Analysis of Systematic Defects in Integrated Circuits. IEEE Des. Test Comput. 29(5): 81-93 (2012) - [j1]Wing Chiu Tam, R. D. (Shawn) Blanton:
SLIDER: Simulation of Layout-Injected Defects for Electrical Responses. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 918-929 (2012) - 2011
- [c9]Wing Chiu Tam, R. D. (Shawn) Blanton:
To DFM or not to DFM? DAC 2011: 65-70 - [c8]Wing Chiu Tam, R. D. (Shawn) Blanton:
Physically-aware analysis of systematic defects in integrated circuits. ITC 2011: 1-10 - [c7]Wing Chiu Tam, Ronald D. Blanton:
SLIDER: A fast and accurate defect simulation framework. VTS 2011: 172-177 - 2010
- [c6]Jeffrey E. Nelson, Wing Chiu Tam, Ronald D. Blanton:
Automatic classification of bridge defects. ITC 2010: 305-314 - [c5]Wing Chiu Tam, Osei Poku, Ronald D. Blanton:
Systematic defect identification through layout snippet clustering. ITC 2010: 378-387 - [c4]Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly:
Evaluating yield and testing impact of sub-wavelength lithography. VTS 2010: 200-205
2000 – 2009
- 2009
- [c3]Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton:
Automated failure population creation for validating integrated circuit diagnosis methods. DAC 2009: 708-713 - [c2]Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton:
Controlling DPPM through Volume Diagnosis. VTS 2009: 134-139 - 2008
- [c1]Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton:
Precise failure localization using automated layout analysis of diagnosis candidates. DAC 2008: 367-372
Coauthor Index
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