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Kenneth S. M. Fung
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2010 – 2019
- 2015
- [j4]Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam:
An INSPECT Measurement System for Moving Objects. IEEE Trans. Instrum. Meas. 64(1): 63-74 (2015) - [c8]Fuqin Deng, Jia Chen, Jianyang Liu, Zhijun Zhang, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam:
An edge-from-focus approach to 3D inspection and metrology. Image Processing: Machine Vision Applications 2015: 94050E - 2013
- [c7]Fuqin Deng, Zhao Li, Jia Chen, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam:
An elliptic phase-shift algorithm for high speed three-dimensional profilometry. Image Processing: Machine Vision Applications 2013: 86610S - [c6]Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam:
A polynomial phase-shift algorithm for high precision three-dimensional profilometry. Image Processing: Machine Vision Applications 2013: 866102 - 2012
- [c5]Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, W. H. Leung, Edmund Y. Lam:
An illumination-invariant phase-shifting algorithm for three-dimensional profilometry. Image Processing: Machine Vision Applications 2012: 830005 - 2010
- [j3]Zhaozheng Hu, Ronald Chung, Kenneth S. M. Fung:
EC-EGI: enriched complex EGI for 3D shape registration. Mach. Vis. Appl. 21(2): 177-188 (2010)
2000 – 2009
- 2009
- [j2]Ada N. Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S. M. Fung, W. H. Leung:
Reference-Free Machine Vision Inspection of semiconductor die Images. Int. J. Image Graph. 9(1): 133-152 (2009) - 2008
- [c4]Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung:
Handling of multi-reflections in wafer bump 3D reconstruction. SMC 2008: 1558-1561 - 2007
- [j1]Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung, Yangsheng Xu:
Optimization of Bit-Pairing Codification with Learning for 3D Reconstruction. Int. J. Image Graph. 7(3): 445-462 (2007) - [c3]Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung:
Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights. IPCV 2007: 157-163 - 2006
- [c2]Shu Yuan, Ronald Chung, Tan Zheng, Jun Cheng, Edmund Y. Lam, Kenneth S. M. Fung, Fan Wang:
A novel design of grating projecting system for 3D reconstruction of wafer bumps. Three-Dimensional Image Capture and Applications 2006: 605601 - [c1]Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung:
Bit-pairing Codification for Binary Pattern Projection System. ICPR (2) 2006: 263-266
Coauthor Index
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